Tortillas/Pizza/Flat Bread

For these products, a series of special measurements have been developed to allow manufacturers to properly quantify critical quality attributes. Measurements sold as Fold Length, Bite Depth, and Diameter ‘Roughness’ are a few examples of attributes that would otherwise be impossible to accurately measure manually in real-time.

In addition, since these products are normally manufactured in a specific pattern, special ‘lane’ analysis can display any measured attribute by lane in order to pinpoint the location of process problems.

Automatic rejection is an important feature of these systems, since irregular and misshaped products can jam-up downstream packaging equipment and cause production downtime.

LEARN MORE about the Sightline products best suited for the inspection of tortillas, flatbread and pizza: Benchtop Inspection System, Over-Line Inspection System, In-Line Inspection System, Automation Solutions and Software Reporting & Analysis.

LATEST NEWS & EVENTS

March 1, 2020
Meet Sightline at BakingTech 2020

Meet Sightline at BakingTech 2020

MarketPlace 2020 Table Top Exhibition, March 1 – 3, at the Hilton Chicago in Chicago, IL, is the leading showcase of the latest products, technology, and services for the wholesale baking industry.
January 22, 2020
Brian Mitchell Joins KPM as CEO

Brian Mitchell Joins KPM As CEO

KPM Analytics announced today that Brian Mitchell has joined as Chief Executive Officer. “Brian’s analytical sciences experience combined with his very strong commercial orientation is perfectly suited to drive KPM Analytics and it’s operating companies’ growth in our next phase.” - Morgan Jones, Managing Partner, Union Park Capital.
December 5, 2019
Visit Sightline at IPPE 2020

Automated Inspection Solutions for Poultry & Eggs

Sightline is excited to show off some exciting product advancements since last year's show. The Benchtop QA Measurement System will be front and center in our booth again this year, backed up by the introduction of our Egg Counting & Packing System.