Better Measurements, More Measurements

Accurate and reliable quality assurance (QA) measurements are critical to any manufacturing operation, and are the key to ensuring product quality, specification compliance and process optimization. Sightline inspection systems are designed to provide these critical measurements faster and with better repeatability than manual measurements, while providing the ability to measure and quantify product attributes that are difficult or impossible to calculate manually.


Complete Versatility

The Sightline Benchtop Systems are the most versatile of any inspection system: they provide the ability to measure any product, in any orientation, and immediately generate, display and store all of the desired product attributes. In addition, these systems can connect directly to a variety of external devices such as weigh scales, in order to automatically integrate this data into the system.


Simpler and Faster

The Benchtop’s ease-of-use also eliminates the need for complicated measurement procedures, and dramatically reduces the workload and skill required to generate QA data. Scheduled QA checks can now be completed in a fraction of the time normally required, with all of the data automatically recorded and stored on your network.

CONTACT SIGHTLINE for more information.

LATEST NEWS & EVENTS

January 22, 2019

Meet Us at Table #709 at BakingTech 2019

If you’re in the wholesale baking industry, BakingTech & MarketPlace 2019 are must attend events for your 2019 trade show calendar. MarketPlace 2019 Table Top Exhibition, […]
January 11, 2019
Visit Sightline at IPPE in Booth B8247

Visit Sightline at IPPE in Atlanta!

The IPPE will be welcoming more than 1,200 exhibitors and over 30,000 visitors at the Georgia World Congress Centre in Atlanta from February 12-14. You can […]
July 11, 2018

Visit Sightline at Pack Expo 2018 in Chicago!

Visit Sightline at Pack Expo 2018 in Chicago! With its massive show floor full of machinery in action and packaging solutions for every industry imaginable, attending […]